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Detail
Journal Article
Formation and interface characterization of Bi2Se3/ YBa2Cu3O7 thin films via two-step growth using cracked-Se technique
- Authors
- Woo-Jung Lee, Tae-Ha Hwang, Dae-Hyung Cho, Jaehan Park, Mann-Ho Cho, Yong-Duck Chung
- Issue Date
- 2025-12
- Citation
- ETRI Journal, v.권호미정, pp.1-10
- ISSN
- 1225-6463
- Publisher
- 한국전자통신연구원
- Language
- English
- Type
- Journal Article
- KSP Keywords
- cracked-Se, interface characterization, thin film(TF), two-step growth
This work is distributed under the term of Korea Open Government License (KOGL)
(Type 4: : Type 1 + Commercial Use Prohibition+Change Prohibition)
(Type 4: : Type 1 + Commercial Use Prohibition+Change Prohibition)
