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Journal Article Advanced Optical Design and Evaluation of a Plenoptic Microscope for Extended 3D Imaging Capabilities
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Authors
Chihoon Kim, Myungjoo Kang, Munseob Lee
Issue Date
2026-01
Citation
IEEE Transactions on Instrumentation and Measurement, v.75, pp.1-10
ISSN
0018-9456
Publisher
IEEE
Language
English
Type
Journal Article
DOI
https://dx.doi.org/10.1109/TIM.2025.3648093
Abstract
Plenoptic systems represent a significant advancement in imaging technology, enabling sophisticated 3-D image capture with a single exposure. This study presents the development of a microscope system for microscale applications, based on plenoptic principles. The proposed system incorporates a microlens array (MLA) designed and fabricated with minimal errors through optical simulation and a custom-designed lens jig. Precise optical alignment was performed to optimize the system performance, ensuring improved spatial resolution and depth of field (DOF) by matching the numerical apertures (NAs) of the MLA and the tube lens. The system achieved a spatial resolution of 12.4 μm, with contrast ratios of 90% and 97% in the horizontal and vertical directions, respectively. Additionally, the DOF was enhanced by 1.6×, increasing from the theoretical value of 630– 1000 μm. The analysis revealed that high-frequency components were more sensitive to variations in the DOF relative to the spatial frequency, whereas low-frequency components maintained high clarity over an extended range.
Keyword
3-D imaging, depth of field (DOF), light-field imaging, microlens array (MLA), numerical aperture (NA) matching, plenoptic microscopy
KSP Keywords
3D images, 3D imaging, Depth of Field, Design evaluation, High frequency(HF), Image capture, Imaging technology, Low frequency, Microlens array, Numerical aperture, Optical Design