IEMEK Symposium on Embedded Technology (ISET) 2026, pp.1-1
Publisher
대한임베디드공학회
Language
Korean
Type
Conference Paper
Abstract
업용 비지도 이상 탐지 모델은 정상 데이터로만 훈련되어 과적합에 취약하다. 기존 이상 탐
지 모델은 정적인 가우시안 노이즈에 의존해 판별자가 이를 단순 암기하며 일반화 성능이 급감하는 한계
가 있다. 이를 극복하기 위해 다각적 정규화 기법을 도입한 SimpleNet++를 제안한다. 핵심 구조는 세 가
지다. 첫째, 의미론적으로 안전한 광학 증강으로 픽셀 단위 암기를 방지해 정상 데이터 다양성을 확보한
다. 둘째, 적대적 노이즈 생성기를 도입해 판별자가 속기 쉬운 까다로운 가짜 특징을 만들어 더 견고한 결
정 경계를 학습하도록 강제한다. 셋째, 훈련 불안정성을 제어하고자 이전 에포크의 우수한 모델 출력을 앵
커로 삼는 온라인 자기 증류 기법을 적용했다. MVTec AD 데이터셋 평가 결과, 전역적 특징 표현에 집중
한 탓에 픽셀 수준 국소화(P-AUROC) 성능은 미미하게 감소했다. 하지만 이미지 수준 이상 탐지
(I-AUROC)는 99.70%를 달성해 기존 SimpleNet과 PatchCore를 능가했다. 이를 통해 본 논문에서 제안
한 정규화 전략이 모델 과적합을 효과적으로 억제하고 일반화 성능을 달성하였음을 입증하였다.
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J. Kim et. al, "Trends in Lightweight Kernel for Many core Based High-Performance Computing", Electronics and Telecommunications Trends. Vol. 32, No. 4, 2017, KOGL Type 4: Source Indication + Commercial Use Prohibition + Change Prohibition
J. Sim et.al, “the Fourth Industrial Revolution and ICT – IDX Strategy for leading the Fourth Industrial Revolution”, ETRI Insight, 2017, KOGL Type 4: Source Indication + Commercial Use Prohibition + Change Prohibition
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