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Conference Paper
Phase Retrieval in Reflection Microscopy via TIE-Consistent Reference Selection and Neural Defocus Field
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- Authors
- Youngjun Lim
- Issue Date
- 2026-07
- Citation
- Opto-Electronics and Communications Conference (OECC) 2026, pp.980-981
- Publisher
- IEEE
- Language
- English
- Type
- Conference Paper
- Abstract
- A hybrid framework for stable reflection-type transport of intensity equation (TIE) phase retrieval is proposed. By optimizing reference planes and learning neural defocus fields, the method ensures consistency and repeatability despite mechanical uncertainties.
- KSP Keywords
- Hybrid framework, Phase Retrieval, Reflection-type, Transport of intensity equation, reference plane