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Conference Paper
Chromatic Dispersion Measurement of Nano-Silicon Waveguides Using a White-Light Interferometry Method
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- Authors
- Seung Hwan Kim, Seoung Hun Lee, Dong Wook Kim, Kyong Hon Kim, El-Hang Lee, JongMoo Lee
- Issue Date
- 2011-01
- Citation
- Optoelectronic Integrated Circuits XIII (SPIE 7942), pp.1-7
- Publisher
- SPIE
- Language
- English
- Type
- Conference Paper
- Abstract
- We report a white-light Mach-Zehnder interferometry method for an accurate measurement of spectral distribution of the chromatic dispersion coefficient of very short optical waveguides over a wavelength range of 1520~1560 nm. The chromatic dispersion curve of a 7.6 mm long silicon nano-waveguide of 400 nm width and 250 nm height was successfully measured by confirming the method with standard single-mode fibers up to 3 cm length, for which its total chromatic dispersion is as small as 0.51 fs/nm. This method will be very useful for determination of chromatic dispersion profile of compact nanowaveguide devices.
- KSP Keywords
- 1560 nm, Accurate measurement, Chromatic dispersion(CD), Mach-Zehnder(MZ), Mach-zehnder interferometry, Nano-silicon, Optical waveguides, Silicon waveguide, Single-mode fiber(SMF), White-light interferometry, chromatic dispersion coefficient