ETRI-Knowledge Sharing Plaform

KOREAN
논문 검색
Type SCI
Year ~ Keyword

Detail

Conference Paper KA and Ray Tracing Approximation on the Surface Roughness
Cited - time in scopus Share share facebook twitter linkedin kakaostory
Authors
Young-Keun Yoon, JongHo Kim
Issue Date
2011-07
Citation
Antennas and Propagation Society International Symposium (APSURSI) 2011, pp.3355-3357
Publisher
IEEE
Language
English
Type
Conference Paper
DOI
https://dx.doi.org/10.1109/APS.2011.6058705
Abstract
This paper is given the results compared Kirchhoff with ray tracing method for scattering characteristics due to the roughness on the periodic surface. Analysis method used first order Kirchhoff approximation and ray tracing based on viewing volume tube. Finally, there is proved that the provided approximation methods are possible to support to extract practical scattering characteristics.
KSP Keywords
Analysis method, Approximation methods, First order, Ray tracing method, Surface roughness, kirchhoff approximation, scattering characteristics