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Conference Paper 3D SiP Module Using TSV and Novel Low-Volume Solder-on-Pad(SoP) Process
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Authors
Hyun-Cheol Bae, Ho-Eun Bae, Su-Jeong Jeon, Kwang-Hoon Jung, Yong-Sung Eom, Kwang-Seong Choi
Issue Date
2012-09
Citation
Electronic System-Integration Technology Conference (ESTC) 2012, pp.1-4
Publisher
IEEE
Language
English
Type
Conference Paper
DOI
https://dx.doi.org/10.1109/ESTC.2012.6542209
Abstract
In this paper, a three-dimensional system in packaging (3D SiP) module in which a bottom interposer and a top interposer are interconnected vertically with the low-volume solder-on-pad (SoP) and through-silicon vias (TSVs) has been presented. A novel solder bumping material has been developed for the low-volume SoP and the thickness of SoP was measured about 10 μm. The low-volume SoP was evaluated by the cross-sectional photographs and the measurement of dc resistance using daisy-chain patterns. 3D SiP module composed of a GPU and two SRAM on the interposers were fabricated with this bumping material, a fluxless underfill and the vertical interconnection processes.
KSP Keywords
3D SiP, Cross-sectional, DC Resistance, Solder bumping, Three dimensional(3D), Through silicon vias(TSV), Vertical interconnection, low-volume, three-dimensional system