상세정보
학술지
Continuous-Wave Terahertz System Based on a Dual-Mode Laser for Real-Time Non-Contact Measurement of Thickness and Conductivity
- 발행일
- 201402
- 출처
- Optics Express, v.22 no.3, pp.2259-2266
- ISSN
- 1094-4087
- 출판사
- Optical Society of America(OSA)
- 협약과제
- 13VE1200, 테라헤르츠 영상?분광 복합 포터블 스캐너 기술 개발 , 박경현
- 초록
- Terahertz (THz) waves have been exploited for the non-contact measurements of thickness and refractive index, which has enormous industrial applicability. In this work, we demonstrate a 1.3-μm dual-mode laser (DML)-based continuous-wave THz system for the real-time measurement of a commercial indium-tin-oxide (ITO)-coated glass. The system is compact, cost-effective, and capable of performing broadband measurement within a second at the setting resolution of 1 GHz. The thickness of the glass and the sheet conductivity of the ITO film were successfully measured, and the measurements agree well with those of broadband pulse-based time domain spectroscopy and Hall measurement results. © 2014 Optical Society of America.
- KSP 제안 키워드
- Broadband measurement, Broadband pulse, Coated glass, Continuous-wave terahertz, Dual-mode laser, Hall measurement, ITO film, Non-contact measurement, Real-time measurement, THz system, continuous wave(CW)