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Detail
Journal Article
Continuous-Wave Terahertz System Based on a Dual-Mode Laser for Real-Time Non-Contact Measurement of Thickness and Conductivity
- Issue Date
- 2014-02
- Citation
- Optics Express, v.22, no.3, pp.2259-2266
- ISSN
- 1094-4087
- Publisher
- Optical Society of America(OSA)
- Language
- English
- Type
- Journal Article
- Abstract
- Terahertz (THz) waves have been exploited for the non-contact measurements of thickness and refractive index, which has enormous industrial applicability. In this work, we demonstrate a 1.3-μm dual-mode laser (DML)-based continuous-wave THz system for the real-time measurement of a commercial indium-tin-oxide (ITO)-coated glass. The system is compact, cost-effective, and capable of performing broadband measurement within a second at the setting resolution of 1 GHz. The thickness of the glass and the sheet conductivity of the ITO film were successfully measured, and the measurements agree well with those of broadband pulse-based time domain spectroscopy and Hall measurement results. © 2014 Optical Society of America.
- KSP Keywords
- Broadband pulse, Coated glass, Continuous-wave terahertz, Dual-mode laser, Hall measurement, ITO film, Indium Tin Oxide(ITO), Real-time measurement, THz system, broadband measurement, continuous wave(CW)
This work is distributed under the term of Creative Commons License (CCL)
(CC BY)
(CC BY)
