Subjects :
thickness measurement
논문 검색결과
| Type |
Year |
Title |
Cited |
Download |
|
Journal
|
2019 |
Terahertz Continuous Wave System using Phase Shift Interferometry for Measuring the Thickness of Sub-100-μm-thick Samples without Frequency Sweep
Dahye Choi Optics Express, v.27, no.10, pp.14695-14704 |
8 |
원문
|
|
Conference
|
2015 |
Portable Terahertz Scanner for Imaging and Spectroscopy Using InP-Related Devices
Park Kyung Hyun Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications VIII (SPIE 9362), pp.1-11 |
0 |
원문
|
|
Journal
|
2012 |
Simple and cost-effective thickness measurement terahertz system based on a compact 155 μm λ/4 phase-shifted dual-mode laser
Han-Cheol Ryu Optics Express, v.20, no.23, pp.25990-25999 |
46 |
원문
|
특허 검색결과
| Status |
Year |
Patent Name |
Country |
Family Pat. |
KIPRIS |
|
No search results. |
연구보고서 검색결과
| Type |
Year |
Research Project |
Primary Investigator |
Download |
|
No search results. |