Subjects : Growth constants
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2010 | In-Situ Transmission Electron Microscopy Investigation of the Interfacial Reaction between Er and SiO2 Films 최철종 Materials Transactions, v.51, no.4, pp.793-798 | 3 | 원문 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
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| Type | Year | Research Project | Primary Investigator | Download |
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