Subjects : Thermal activation energy
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2013 | Comparative studies on electrical bias temperature instabilities of In–Ga–Zn–O thin film transistors with different device configurations Ryu Min Ki Solid-State Electronics, v.89, pp.171-176 | 21 | 원문 |
| Journal | 2009 | Impact of device configuration on the temperature instability of Al–Zn–Sn–O thin film transistors Jae Kyeong Jeong Applied Physics Letters, v.95, no.12, pp.123505-1-123505-3 | 60 | 원문 |
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| Type | Year | Research Project | Primary Investigator | Download |
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