Subjects : Instability phenomena
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Conference | 2011 | Drain Bias Induced Instability Characteristics in Oxide Thin Film Transistors Yang Shinhyuk International Meeting on Information Display (IMIT) 2011, pp.115-116 |
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| Type | Year | Research Project | Primary Investigator | Download |
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