Subjects : White-light interferometer
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2012 | A New Method of Measuring Localized Chromatic Dispersion of Structured Nanowaveguide Devices Using White-Light Interferometry 김동욱 IEEE/OSA Journal of Lightwave Technology, v.30, no.1, pp.43-48 | 10 | 원문 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
|---|---|---|---|---|---|
| No search results. | |||||
| Type | Year | Research Project | Primary Investigator | Download |
|---|---|---|---|---|
| No search results. | ||||