Subjects : Rise rate
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Conference | 2021 | Analysis for Dynamic Characteristics of Metal-Oxide-Semiconductor (MOS) Controlled Thyristor (MCT) Depending on Snap-Back Effect Hyun-Gyu Jang International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC) 2021, pp.487-489 |
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| Type | Year | Research Project | Primary Investigator | Download |
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