Subjects : K-2
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2013 | Seebeck Coefficient Characterization of Highly Doped n- and p-Type Silicon Nanowires for Thermoelectric Device Applications Fabricated with Top-Down Approach Kim Jae Hyeon Journal of Nanoscience and Nanotechnology, v.13, no.9, pp.6416-6419 | 12 | 원문 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
|---|---|---|---|---|---|
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| Type | Year | Research Project | Primary Investigator | Download |
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