Subjects : subthreshold current
| Type | Year | Title | Cited | Download |
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| Journal | 2009 | Impact of Sn/Zn Ratio on the Gate Bias and Temperature-Induced Instability of Zn-In-Sn-O thin Film Transistors Ryu Min Ki Applied Physics Letters, v.95, no.17, pp.173508-1-173508-3 | 105 | 원문 |
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| Type | Year | Research Project | Primary Investigator | Download |
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