Subjects : Energetic oxygen
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2014 | Influence of Gate Dielectric/Channel Interface Engineering on the Stability of Amorphous Indium Gallium Zinc Oxide Thin-Film Transistors Cho Sung Haeng Physica Status Solidi (A), v.211, no.9, pp.2126-2133 | 21 | 원문 |
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| Type | Year | Research Project | Primary Investigator | Download |
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