Subjects : Oxide trap density
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2003 | 1/f noise in Si/sub 0.8/Ge/sub 0.2/ pMOSFETs under Fowler-Nordheim stress Young Joo Song IEEE Transactions on Electron Devices, v.50, no.4, pp.1152-1156 | 12 | 원문 |
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| Type | Year | Research Project | Primary Investigator | Download |
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