Subjects : XRD data
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2016 | Dependence of GaN Channel Thickness on the Transistor Characteristics of AlGaN/GaN HEMTs Grown on Sapphire Sungjae Chang ECS Journal of Solid State Science and Technology, v.5, no.12, pp.N102-N107 | 6 | 원문 |
| Journal | 2007 | Analysis of the Surface Morphology and the Resistance of VO2 Thin Films on M-Plane Al2O3 Kim Bongjun Journal of the Korean Physical Society, v.50, no.3, pp.653-656 | 23 | 원문 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
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| Type | Year | Research Project | Primary Investigator | Download |
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