Subjects : Time dependence
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2009 | Comparative Study of Electrical Instabilities in Top-Gate InGaZnO thin Film Transistors with Al2O3 and Al2O3/SiNx Gate Dielectrics 이정민 Applied Physics Letters, v.94, no.22, pp.1-4 | 109 | 원문 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
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| Type | Year | Research Project | Primary Investigator | Download |
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