Subjects : admittance measurement
| Type | Year | Title | Cited | Download |
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| Conference | 2006 | New Analysis on the Interface Trap States at Schottky Contact Jun Myung Sim International Conference on the Physics of Semiconductors (ICPS) 2006, pp.1-2 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
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| Type | Year | Research Project | Primary Investigator | Download |
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