Subjects : Atomic force microcopy
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2020 | Recess-Etched and Tetramethylammonium Hydroxide-Treated Nanoscale Pattern on AlGaN/GaN High-Electron-Mobility-Transistors for Improved Ohmic Contact 도재원 Journal of the Korean Physical Society, v.76, no.9, pp.837-842 | 0 | 원문 |
| Journal | 2020 | Recess-Etched and Tetramethylammonium Hydroxide-Treated Nanoscale Pattern on AlGaN/GaN High-Electron-Mobility-Transistors for Improved Ohmic Contact Jung Hyunwook Journal of the Korean Physical Society, v.76, no.9, pp.837-842 | 0 | 원문 |
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| Type | Year | Research Project | Primary Investigator | Download |
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