Subjects : surface traps
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2013 | Capacitance–voltage characterization of surface-treated Al2O3/GaN metal–oxide–semiconductor structures Bae Sung-Bum Microelectronic Engineering, v.109, pp.10-12 | 6 | 원문 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
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| Type | Year | Research Project | Primary Investigator | Download |
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