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Conference
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2025 |
Plant Deployment of a 3D Modeling and SLAM-Based Inspection System
Chang Jiho International Conference on Consumer Electronics (ICCE) 2025 : Asia, pp.1-6 |
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Journal
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2025 |
Monte-Carlo simulation for the optimization of a fan-beam X-ray backscatter system for the identification of human remains
Choi Sunghoon Radiation Physics and Chemistry, v.229, pp.1-10 |
1 |
원문
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Conference
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2024 |
Autonomous Structural Inspection with an Octocopter UAV: Integration of 3D LiDAR and Gimbal-Mounted Camera
Son Ji Hwan International Conference on Systems, Man, and Cybernetics (SMC) 2024, pp.2028-2034 |
0 |
원문
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Journal
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2023 |
Multi-Branch Deep Fusion Network-Based Automatic Detection of Weld Defects Using Non-Destructive Ultrasonic Test
Kyeeun Kim IEEE Access, v.11, pp.114489-114496 |
12 |
원문
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Journal
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2023 |
Image-Based Inspection System of Firefighting Facilities Using Augmented Reality
Dasom Oh 한국화재소방학회 논문지, v.37, no.3, pp.41-48 |
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원문
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Conference
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2022 |
Inspection System of Firefighting Facilities Based on YOLOv4 Using Augmented Reality Glass
Dasom Oh International Conference on Information and Communication Technology Convergence (ICTC) 2022, pp.1604-1608 |
2 |
원문
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Journal
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2022 |
Implementation of Deep Learning-based Label Inspection System Applicable to Edge Computing Environments
배주원 대한임베디드공학회논문지, v.17, no.2, pp.77-83 |
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원문
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Conference
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2015 |
An Inspection Method for Burrs in an Inlet Side Hole Using a Low Cost Vision System
Hyeonsung Cho International Conference on Information and Communication Technology Convergence (ICTC) 2015, pp.783-786 |
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Journal
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2014 |
Food Inspection System Using Terahertz Imaging
Lee Won Hui Microwave and Optical Technology Letters, v.56, no.5, pp.1211-1214 |
20 |
원문
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Journal
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2009 |
Self-Organized Interconnection Process Using Solderable ACA (Anisotropic Conductive Adhesive)
임병승 Materials Transactions, v.50, no.7, pp.1684-1689 |
7 |
원문
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Journal
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2006 |
Image Processing Based Automatic Inspection for Assembly Line of Automobiles
Chung Yun Koo Key Engineering Materials, v.321, no.알수없음, pp.1288-1292 |
0 |
원문
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Conference
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2005 |
The Detection of Curve-type Defects in the TFT-LCD Panels with Machine Vision
김우섭 TENCON 2005, pp.1-5 |
1 |
원문
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