Subjects : Contact thickness
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Conference | 2014 | Non-Contact Thickness and Conductivity Measurement Using a Continuous-Wave Terahertz Spectrometer based on a 1.3 μm Dual-Mode Laser Moon Kiwon Photonics West 2014, pp.1-1 |
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| Type | Year | Research Project | Primary Investigator | Download |
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