Subjects : defect analysis
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Conference | 2021 | Defect Analysis of Single Crystal Substrate for III-Nitrides using X-ray Topography Bae Sung-Bum 한국방사광이용자협회 방사광 이용자 연구 발표회 2021, pp.47-47 |
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| Type | Year | Research Project | Primary Investigator | Download |
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