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Journal
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2012 |
Current Stress Induced Electrical Instability in Transparent Zinc Tin Oxide Thin-Film Transistors
Cheong Woo-Seok Journal of Nanoscience and Nanotechnology, v.12, no.4, pp.3421-3424 |
18 |
원문
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Journal
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2008 |
Improved Noise Reduction with Packet Loss Recovery Based on Post-Filtering over IP Networks
Kim Jin Sul IEICE Transactions on Communications, v.E91-B, no.3, pp.975-979 |
0 |
원문
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Journal
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2006 |
Significance of Gate Oxide Thinning below 1.5 nm on 1/ f Noise Behavior in n-Channel Metal–Oxide–Semiconductor Field-Effect Transistors under Electrical Stress
Bongki Mheen Japanese Journal of Applied Physics, v.45, no.6A, pp.4943-4947 |
0 |
원문
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