Subjects : electromagnetic characteristics
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Conference | 2013 | Standardization of Calibrating Probe for Chip-Level EMC Yeo Soon Il International Conference on Circuits, Systems, Signal and Telecommunications (CSST) 2013 / International Conference on VLSI Design and Implementation (VLSI) 2013, pp.87-90 | ||
| Journal | 2009 | Internal Resistance of Voltage Source by Use of the Finite-Difference Time-Domain Technique Ae Kyoung Lee IEEE Antennas and Wireless Propagation Letters, v.8, pp.1194-1197 | 0 | 원문 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
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| Type | Year | Research Project | Primary Investigator | Download |
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