Subjects : Program disturbance
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2005 | Highly Reliable Flash Cell for Low Power Application Park Young Sam Japanese Journal of Applied Physics, v.44, no.11, pp.7816-7819 | 1 | 원문 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
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| Type | Year | Research Project | Primary Investigator | Download |
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