Subjects : Nondestructive readout operation
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2010 | Nondestructive Readout Operation of Oxide-Thin-Film-Transistor-Based 2T-Type Nonvolatile Memory Cell Yoon Sung Min IEEE Electron Device Letters, v.31, no.2, pp.138-140 | 14 | 원문 |
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| Type | Year | Research Project | Primary Investigator | Download |
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