Subjects : Contact measurement
Type | Year | Title | Cited | Download |
---|---|---|---|---|
Journal | 2014 | Continuous-Wave Terahertz System Based on a Dual-Mode Laser for Real-Time Non-Contact Measurement of Thickness and Conductivity Moon Kiwon Optics Express, v.22, no.3, pp.2259-2266 | 23 | 원문 |
Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
---|---|---|---|---|---|
No search results. |
Type | Year | Research Project | Primary Investigator | Download |
---|---|---|---|---|
No search results. |