Subjects : Stress-induced
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2009 | Impact of Sn/Zn Ratio on the Gate Bias and Temperature-Induced Instability of Zn-In-Sn-O thin Film Transistors Ryu Min Ki Applied Physics Letters, v.95, no.17, pp.173508-1-173508-3 | 105 | 원문 |
| Journal | 2003 | Characterization of a stress-applied polarization-maintaining (PM) fiber through photoelastic tomography Park Yongwoo IEEE/OSA Journal of Lightwave Technology, v.21, no.4, pp.997-1004 | 21 | 원문 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
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| Type | Year | Research Project | Primary Investigator | Download |
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