Subjects : Depth-dependent
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2025 | Gate Recess Depth-Dependent Performance Variations in AlGaN/GaN HEMTs Induced by Packaging Junhyung Kim Electronics Letters, v.61, no.1, pp.1-4 | 0 | 원문 |
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