Subjects : Interfacial quality
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2006 | Electrical Properties of Aluminum Silicate Films Grown by Plasma Enhanced Atomic Layer Deposition Lim Jungwook Electrochemical and Solid-State Letters, v.9, no.1, pp.F8-F11 | 9 | 원문 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
|---|---|---|---|---|---|
| No search results. | |||||
| Type | Year | Research Project | Primary Investigator | Download |
|---|---|---|---|---|
| No search results. | ||||