Subjects : endurance test
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2011 | Voltage-Pulse-Induced Switching Dynamics in $ \hbox{VO}_{2}$ Thin-Film Devices on Silicon Seo Giwan IEEE Electron Device Letters, v.32, no.11, pp.1582-1584 | 36 | 원문 |
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| Type | Year | Research Project | Primary Investigator | Download |
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