Subjects : surface concentration
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2006 | Characterization of silicon–germanium heterojunction bipolar transistors degradation in silicon–germanium BiCMOS technologies Lee Seung-Yun Solid-State Electronics, v.50, no.3, pp.333-339 | 4 | 원문 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
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| Type | Year | Research Project | Primary Investigator | Download |
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