Subjects : TiN film
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2007 | Stress Reduction During Phase Change in Ge2Sb2Te5 by Capping TiN Film Park Young Sam Journal of Materials Science : Materials in Electronics, v.18, no.10, pp.1079-1082 | 6 | 원문 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
|---|---|---|---|---|---|
| No search results. | |||||
| Type | Year | Research Project | Primary Investigator | Download |
|---|---|---|---|---|
| No search results. | ||||