Subjects : electrode process
Type | Year | Title | Cited | Download |
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Journal | 2023 | Analysis of issues in gate recess etching in the InAlAs/InGaAs HEMT manufacturing process Min Byoung-Gue ETRI Journal, v.45, no.1, pp.171-179 | 4 | 원문 |
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Type | Year | Research Project | Primary Investigator | Download |
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