Subjects : Mixed-mode stress
| Type | Year | Title | Cited | Download |
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| Journal | 2008 | Emitter Scaling Dependence of Mixed-Mode Reliability Degradation in Silicon–Germanium Heterojunction Bipolar Transistors Lee Seung-Yun Japanese Journal of Applied Physics, v.47, no.7, pp.5309-5313 | 2 | 원문 |
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