Subjects : XPS analysis
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2018 | High Performance SONOS Flash Memory with In-Situ Silicon Nanocrystals Embedded in Silicon Nitride Charge Trapping Layer 임재갑 Solid-State Electronics, v.140, pp.134-138 | 14 | 원문 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
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| Type | Year | Research Project | Primary Investigator | Download |
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