Subjects : Junction interface
| Type | Year | Title | Cited | Download |
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| Journal | 2011 | Electrical Characterization of n/p-Type Nickel Silicide/Silicon Junctions by Sb Segregation Jun Myungsim Journal of Nanoscience and Nanotechnology, v.11, no.8, pp.7339-7342 | 0 | 원문 |
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