Subjects : Sputtering conditions
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2009 | Evaluation of 1/f Noise Characteristics for Si-Based Infrared Detection Materials Ryu Hojun ETRI Journal, v.31, no.6, pp.703-708 | 3 | 원문 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
|---|---|---|---|---|---|
| No search results. | |||||
| Type | Year | Research Project | Primary Investigator | Download |
|---|---|---|---|---|
| No search results. | ||||