Subjects : hard switching
Type | Year | Title | Cited | Download |
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Journal | 2017 | Pulse-Mode Dynamic Ron Measurement of Large-Scale High-Power AlGaN/GaN HFET Minki Kim ETRI Journal, v.39, no.2, pp.292-299 | 5 | 원문 |
Journal | 2013 | Reverse-Conducting IGBT Using MEMS Technology on the Wafer Back Side Won Jong Il ETRI Journal, v.35, no.4, pp.603-609 | 12 | 원문 |
Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
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Type | Year | Research Project | Primary Investigator | Download |
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