Subjects : interface characterization
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2025 | Formation and interface characterization of Bi2Se3/ YBa2Cu3O7 thin films via two-step growth using cracked-Se technique Hwang Tae-Ha ETRI Journal, v.권호미정, pp.1-10 | 원문 | |
| Journal | 2025 | Formation and interface characterization of Bi2Se3/ YBa2Cu3O7 thin films via two-step growth using cracked-Se technique Lee Woo Jung ETRI Journal, v.권호미정, pp.1-10 | 원문 | |
| Conference | 2016 | Interface Characterization of ZnS Buffer Layer Prepared by Sulfur Thermal Cracker on Cu(In,Ga)Se2 Absorber for Photovoltaic Application Cho Daehyung European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) 2016, pp.1-3 |
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| Type | Year | Research Project | Primary Investigator | Download |
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