Subjects : Reliability issue
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Conference | 2016 | A Comparison of ESD Protection Circuits using Low Trigger Techniques in 0.13 um CMOS Process Jung Jin Woo 대한전자공학회 학술 대회 (추계) 2016, pp.200-203 |
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| Type | Year | Research Project | Primary Investigator | Download |
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