Subjects : Metallic Cu
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2009 | Electrical, Structural and Optical Characterization of Copper Oxide thin Films as a Function of Post Annealing Temperature V. Figueiredo Physica Status Solidi (A), v.206, no.9, pp.2143-2148 | 71 | 원문 |
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| Type | Year | Research Project | Primary Investigator | Download |
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