Subjects : Power spectra density
| Type | Year | Title | Cited | Download |
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| Journal | 2012 | Current Stress Induced Electrical Instability in Transparent Zinc Tin Oxide Thin-Film Transistors Cheong Woo-Seok Journal of Nanoscience and Nanotechnology, v.12, no.4, pp.3421-3424 | 18 | 원문 |
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| Type | Year | Research Project | Primary Investigator | Download |
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