Subjects : Diode parameters
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2017 | High Temperature Storage Test and Its Effect on the Thermal Stability and Electrical Characteristics of AlGaN/GaN High Electron Mobility Transistors Jongmin Lee Current Applied Physics, v.17, no.2, pp.157-161 | 16 | 원문 |
| Conference | 2016 | Temperature Dependence of Current-voltage Characteristics of Packaged AlGaN/GaN HEMT on SiC Substrate Jongmin Lee 한국 반도체 학술 대회 (KCS) 2016, pp.1-2 |
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| Type | Year | Research Project | Primary Investigator | Download |
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