Subjects : dispersion measurement
| Type | Year | Title | Cited | Download |
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| Conference | 2011 | Chromatic Dispersion Measurement of Nano-Silicon Waveguides Using a White-Light Interferometry Method Seung Hwan Kim Optoelectronic Integrated Circuits XIII (SPIE 7942), pp.1-7 | 2 | 원문 |
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| Type | Year | Research Project | Primary Investigator | Download |
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