Subjects : Top contact configuration
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2024 | Deep-Submicron Channel Length Oxide Semiconductor Thin-Film Transistors Enabled by Self-Aligned Nanogap Lithography Sung Chihun IEEE Electron Device Letters, v.45, no.6, pp.1020-1023 | 2 | 원문 |
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